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ToF-SIMS of metal-complex-based supramolecular architectures on oxide surfaces

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ToF-SIMS of metal-complex-based supramolecular architectures on oxide surfaces

Auteurs : RBID : Pascal:13-0099525

Descripteurs français

Pascal (Inist)
- SIMS, Méthode temps vol, Spectrométrie optique, Indium, Méthode couche atomique, Autoassemblage, Préparation, Gradin, Multicouche, Epaisseur, Fil moléculaire, Oxyde de silicium, O Si, SiO2, In, Composé minéral, Composé de métal de transition.
Wicri :
- concept : Composé minéral.

English descriptors

KwdEn :
- Atomic layer method, Indium, Inorganic compounds, Molecular wires, Multilayers, Optical spectrometry, Preparation, SIMS, Self-assembly, Silicon oxides, Step, Thickness, Time-of-flight method, Transition element compounds.

Abstract

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was applied in combination with optical absorption spectroscopy for studying the anchoring of polypyridine-based supramolecular layers on oxide surfaces, such as quartz or indium tin oxide, by means of a layer-by-layer method involving a self-assembly process relying on coordination interactions that lead to the formation, at the surface, of metal-complex-based layers. ToF-SIMS measurements were crucial in setting up the strategy for the preparation of the above systems, as they allowed a detailed monitoring of each preparation step and provided direct qualitative information on the successful anchoring at the surface. Optical measurements, on the other hand, provided quantitative information on the growth of the multilayers, beyond the thickness sampled by static-SIMS.

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Pascal:13-0099525

Le document en format XML

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<author><name sortKey="Spampinato, V" uniqKey="Spampinato V">V. Spampinato</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>LAMSUN, Laboratory for Molecular Surfaces and Nanotechnologies, Dipartimento di Scienze Chimiche, Università degli Studi di Catania</s1>
<s2>Catania</s2>
<s3>ITA</s3>
<sZ>1 aut.</sZ>
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<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
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<country>Italie</country>
<wicri:noRegion>Catania</wicri:noRegion>
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<author><name sortKey="Vitale, S" uniqKey="Vitale S">S. Vitale</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>LAMSUN, Laboratory for Molecular Surfaces and Nanotechnologies, Dipartimento di Scienze Chimiche, Università degli Studi di Catania</s1>
<s2>Catania</s2>
<s3>ITA</s3>
<sZ>1 aut.</sZ>
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<country>Italie</country>
<wicri:noRegion>Catania</wicri:noRegion>
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<author><name sortKey="Quici, S" uniqKey="Quici S">S. Quici</name>
<affiliation wicri:level="1"><inist:fA14 i1="02"><s1>CNR Istituto di Scienze e Tecnologie Molecolari Milano</s1>
<s3>ITA</s3>
<sZ>3 aut.</sZ>
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<country>Italie</country>
<wicri:noRegion>CNR Istituto di Scienze e Tecnologie Molecolari Milano</wicri:noRegion>
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<author><name sortKey="Torrisi, A" uniqKey="Torrisi A">A. Torrisi</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>LAMSUN, Laboratory for Molecular Surfaces and Nanotechnologies, Dipartimento di Scienze Chimiche, Università degli Studi di Catania</s1>
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<author><name sortKey="Stepanenko, V" uniqKey="Stepanenko V">V. Stepanenko</name>
<affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Universität Würzburg Institut für Organische Chemie Würzburg</s1>
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<sZ>6 aut.</sZ>
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<country>Allemagne</country>
<wicri:noRegion>Universität Würzburg Institut für Organische Chemie Würzburg</wicri:noRegion>
<wicri:noRegion>Universität Würzburg Institut für Organische Chemie Würzburg</wicri:noRegion>
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</author>
<author><name sortKey="W Rthner, F" uniqKey="W Rthner F">F. W Rthner</name>
<affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Universität Würzburg Institut für Organische Chemie Würzburg</s1>
<s3>DEU</s3>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
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<country>Allemagne</country>
<wicri:noRegion>Universität Würzburg Institut für Organische Chemie Würzburg</wicri:noRegion>
<wicri:noRegion>Universität Würzburg Institut für Organische Chemie Würzburg</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Licciardello, A" uniqKey="Licciardello A">A. Licciardello</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>LAMSUN, Laboratory for Molecular Surfaces and Nanotechnologies, Dipartimento di Scienze Chimiche, Università degli Studi di Catania</s1>
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<sZ>1 aut.</sZ>
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<country>Italie</country>
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<seriesStmt><idno type="ISSN">0142-2421</idno>
<title level="j" type="abbreviated">Surf. interface anal.</title>
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<term>Indium</term>
<term>Inorganic compounds</term>
<term>Molecular wires</term>
<term>Multilayers</term>
<term>Optical spectrometry</term>
<term>Preparation</term>
<term>SIMS</term>
<term>Self-assembly</term>
<term>Silicon oxides</term>
<term>Step</term>
<term>Thickness</term>
<term>Time-of-flight method</term>
<term>Transition element compounds</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>SIMS</term>
<term>Méthode temps vol</term>
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<term>Méthode couche atomique</term>
<term>Autoassemblage</term>
<term>Préparation</term>
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<term>Multicouche</term>
<term>Epaisseur</term>
<term>Fil moléculaire</term>
<term>Oxyde de silicium</term>
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<front><div type="abstract" xml:lang="en">Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was applied in combination with optical absorption spectroscopy for studying the anchoring of polypyridine-based supramolecular layers on oxide surfaces, such as quartz or indium tin oxide, by means of a layer-by-layer method involving a self-assembly process relying on coordination interactions that lead to the formation, at the surface, of metal-complex-based layers. ToF-SIMS measurements were crucial in setting up the strategy for the preparation of the above systems, as they allowed a detailed monitoring of each preparation step and provided direct qualitative information on the successful anchoring at the surface. Optical measurements, on the other hand, provided quantitative information on the growth of the multilayers, beyond the thickness sampled by static-SIMS.</div>
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<fA14 i1="03"><s1>Universität Würzburg Institut für Organische Chemie Würzburg</s1>
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<fA18 i1="02" i2="1"><s1>The Fondazione Bruno Kessler</s1>
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<fC01 i1="01" l="ENG"><s0>Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was applied in combination with optical absorption spectroscopy for studying the anchoring of polypyridine-based supramolecular layers on oxide surfaces, such as quartz or indium tin oxide, by means of a layer-by-layer method involving a self-assembly process relying on coordination interactions that lead to the formation, at the surface, of metal-complex-based layers. ToF-SIMS measurements were crucial in setting up the strategy for the preparation of the above systems, as they allowed a detailed monitoring of each preparation step and provided direct qualitative information on the successful anchoring at the surface. Optical measurements, on the other hand, provided quantitative information on the growth of the multilayers, beyond the thickness sampled by static-SIMS.</s0>
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ToF-SIMS of metal-complex-based supramolecular architectures on oxide surfaces

ToF-SIMS of metal-complex-based supramolecular architectures on oxide surfaces

Descripteurs français

English descriptors

Abstract

Links toward previous steps (curation, corpus...)

Links to Exploration step

Le document en format XML

Pour manipuler ce document sous Unix (Dilib)

Pour mettre un lien sur cette page dans le réseau Wicri